INVITED SPEAKERS


Plenary Lecture
George Whitesides Harvard University (USA)
Unconventional Nanofabrication.
Closing Lecture
Patrice Millet European Commission

Energy vision for Europe and Materials Issues

Invited Speakers
Dave Castner University of Washigton - Seattle (USA) Architecture, Structure and Hybridization Properties of Surface Immobilized DNA Oligomers.
Don Baer Pacific Northwest National Laboratory, Richland (USA) Characterization Challenges for Nanomaterials.
Jaap Boon FOM Institute AMOLF (The Netherlands) Surface Analytical Imaging Microscopy of Paint Cross Sections from Old Master Paintings: Research Challenges and New Vistas from Ion Polished Paint Surfaces.
Yves Dufrene Université catholique de Louvain (Belgium) Nanoscale Exploration of Biosurfaces using AFM.
Howard Fairbrother John Hopkins University Baltimore (USA) Surface Characterization and Reactivity of Carbonaceous Materials in Aquatic Environments.
Chris Grovenor Oxford University (UK) Progress in Nano-Characterization of Metallic and Biological Materials by NanoSIMS.
Andreas Hollander Fraunhofer-Institut für Angewandte Polymerforschung
Berlin (Germany)
New Challenges and Recent Progress in the Analysis of
Functionalized Polymer Surfaces.
Graham Leggett University of Sheffield (UK) Photolithography Beyond the Diffraction Limit.
Philippe Marcus Ecole nationale supérieure de chimie et de physique,
Paris (France )

Nano-Characterization of Metallic Surfaces and Thin Oxide Films in Aqueous Solution.
Jean-Michel Martin Ecole centrale de Lyon (France) Surface Analysis of Tribological Surfaces by XPS, XANES and ToF-SIMS
Vladimir Matolin Charles University Prague (Czech Republic) Photoemission Study of Model Catalysts - Angle Resolved and
Resonant Spectroscopy.
Carlos Palacio Universidad Autónoma de Madrid (Spain) The Application of ITTFA and ARXPS to Study the Ion Beam Mixing of Metal/Si Bilayers
Cristina Satriano Università di Catania (Italy) Tayloring Polymer-Biomolecule Interactions: Surface Characterization and Modification.
Ken Shimizu Keio University Yokohama (Japan) rf-GDOES Depth Profiling Analysis of Ultra-Thin Layers with the
Atomic Scale Depth Resolution .
Wim Sloof Delft University of Technology (The Netherlands) Quantitative Analysis Using AES and XPS to Study the Oxidation
of Metals.
George Thompson University of Manchester (UK) Alloy Effects in the Finishing of Aluminium.
Chris Van Haesendonck Katholieke Universiteit Leuven (Belgium) Imaging nanoscale magnetism with scanning probe microscopy.
Peter Weightman University of Liverpool, Liverpool (UK) The application of reflection anisotropy spectroscopy to the characterization of surfaces
Lu-Tao Weng Hong Kong University of Science and technology Polymer Surface Characterization by XPS and ToF-SIMS
Georges Whitesides Harvard University (USA) Electron Transfer across SAMs
Egbert Zojer Graz University of Technology (Austria) Understanding and Controlling the Properties of Interfaces Between
Organic Semiconductors and Noble Metals ­ a Theoretical Perspective.


 

 







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